Research Experience
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2021.09-Now
Waseda University Information Production and Systems Research Center Assistant Professor
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2021.04-2021.09
Waseda University Information Production and Systems Research Center Research Associate
Details of a Researcher
Updated on 2023/11/28
Waseda University Information Production and Systems Research Center Assistant Professor
Waseda University Information Production and Systems Research Center Research Associate
Waseda University Graduate School of Information Production and Systems
Waseda University Graduate School of Information Production and Systems
South China University of Technology School of Electronic Information Electronic Information Engineering
Canton Zhixin High School
電子情報通信学会
Institute of Electrical and Electronics Engineers (IEEE)
2022 VLSI-DAT Best Paper Award
2023.04 DAT Best Paper Award Committee A 0.116pJ/bit Latch-Based True Random Number Generator with Static Inverter Selection and Noise Enhancement
Winner: Xingyu Wang, Ruilin Zhang, Yuxin Wang, Kunyang Liu, Xuanzhen Wang, Hirofumi Shinohara
Excellent Student Award
2021.02 IEEE Fukuoka Section A 373-F2 0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and Vss Bias-Based Dark-Bit Detection
Winner: Kunyang Liu
Student Travel Grant Award
2018.11 IEEE Solid-State Circuits Society A 373 F2 2D Power-Gated EE SRAM Physically Unclonable Function with Dark-Bit Detection Technique
Winner: Kunyang Liu
A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response
Kunyang Liu, Yichen Tang, Shufan Xu, Ruilin Zhang, Hirofumi Shinohara
2023 IEEE Custom Integrated Circuits Conference (CICC) 2023.04 [Refereed]
Authorship:Lead author
Kunyang Liu, Yichen Tang, Shufan Xu, Hirofumi Shinohara
2023 35th International Conference on Microelectronic Test Structure (ICMTS) 2023.03 [Refereed]
Authorship:Lead author
A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance
Kunyang Liu, Gen Li, Zihan Fu, Xuanzhen Wang, Hirofumi Shinohara
ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) 2022.09 [Refereed]
Authorship:Lead author
Kunyang Liu, Kiyoshi Takeuchi, Hirofumi Shinohara
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) 2022.03 [Refereed]
Authorship:Lead author
36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate through In-Cell Hot-Carrier Injection Burn-In
Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Xinpeng Chen, Hirofumi Shinohara
Digest of Technical Papers - IEEE International Solid-State Circuits Conference 64 502 - 504 2021.02 [Refereed]
Authorship:Lead author
A 373-F 0.21%-Native-BER EE SRAM Physically Unclonable Function with 2-D Power-Gated Bit Cells and {V}_{\text{SS } } Bias-Based Dark-Bit Detection
Kunyang Liu, Yue Min, Xuan Yang, Hanfeng Sun, Hirofumi Shinohara
IEEE Journal of Solid-State Circuits 55 ( 6 ) 1719 - 1732 2020.06 [Refereed]
Authorship:Lead author
A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in
Kunyang Liu, Hongliang Pu, Hirofumi Shinohara
Proceedings of the Custom Integrated Circuits Conference 2020-March 2020.03 [Refereed]
Authorship:Lead author
A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement
Kunyang Liu, Xinpeng Chen, Hongliang Pu, Hirofumi Shinohara
IEEE Journal of Solid-State Circuits 56 ( 7 ) 2193 - 2204 2020 [Refereed]
Authorship:Lead author
A 373 F 2 2D Power-Gated EE SRAM Physically Unclonable Function with Dark-Bit Detection Technique
Kunyang Liu, Yue Min, Xuan Yang, Hanfeng Sun, Hirofumi Shinohara
2018 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018 - Proceedings 161 - 164 2018.12 [Refereed]
Authorship:Lead author
Shufan Xu, Kunyang Liu, Yichen Tang, Ruilin Zhang, Hirofumi Shinohara
2023 35th International Conference on Microelectronic Test Structure (ICMTS) 2023.03 [Refereed]
A 0.116pJ/bit Latch-Based True Random Number Generator with Static Inverter Selection and Noise Enhancement
Xingyu Wang, Ruilin Zhang, Yuxin Wang, Kunyang Liu, Xuanzhen Wang, Hirofumi Shinohara
2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022 - Proceedings 2022 [Refereed]
Ruilin Zhang, Xingyu Wang, Luying Wang, Xinpeng Chen, Fan Yang, Kunyang Liu, Hirofumi Shinohara
2021 Symposium on VLSI Circuits 2021.06 [Refereed]
SRAMウィークPUFに基づいた秘密置換を利用したエッジデバイスセキュリティ向けストロングPUF
劉 昆洋, 篠原 尋史 [Invited]
電子情報通信学会集積回路研究会(ICD)、メモリ技術と集積回路技術一般
Presentation date: 2023.04
情報セキュリティのためのラッチ形静的および動的乱数発生回路
篠原 尋史, 劉 昆洋, 張 瑞琳, 王 興宇 [Invited]
電子情報通信学会集積回路研究会(ICD)、アナログ、アナデジ混載、RF及びセンサインタフェース回路、低電圧・低消費電力技術、新デバイス・回路とその応用
Presentation date: 2021.08
A 373F2 2D-Power-Gated EE SRAM Physically Unclonable Function with Dark‐Bit Detection Technique
Kunyang Liu, Hirofumi Shinohara [Invited]
Presentation date: 2019.04
次世代IoTデバイスの安全認証に向けた高耐攻撃性・高スループット・低消費電力ストロングPUF集積回路システム
公益財団法人北九州産業学術推進機構 旭興産グループ研究支援プログラム
Project Year :
劉 昆洋
IEEE JOURNAL OF SOLID-STATE CIRCUITS
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
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