Degree
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2021.04 Waseda University Ph.D.
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2017.09 Waseda University M.E.
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2015.07 South China University of Technology B.E.
Details of a Researcher
Updated on 2021/09/16
2021.04 Waseda University Ph.D.
2017.09 Waseda University M.E.
2015.07 South China University of Technology B.E.
36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate through In-Cell Hot-Carrier Injection Burn-In
Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Xinpeng Chen, Hirofumi Shinohara
Digest of Technical Papers - IEEE International Solid-State Circuits Conference 64 502 - 504 2021.02 [Refereed]
A 373-F 0.21%-Native-BER EE SRAM Physically Unclonable Function with 2-D Power-Gated Bit Cells and {V}_{\text{SS } } Bias-Based Dark-Bit Detection
Kunyang Liu, Yue Min, Xuan Yang, Hanfeng Sun, Hirofumi Shinohara
IEEE Journal of Solid-State Circuits 55 ( 6 ) 1719 - 1732 2020.06 [Refereed]
A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in
Kunyang Liu, Hongliang Pu, Hirofumi Shinohara
Proceedings of the Custom Integrated Circuits Conference 2020-March 2020.03 [Refereed]
A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement
Kunyang Liu, Xinpeng Chen, Hongliang Pu, Hirofumi Shinohara
IEEE Journal of Solid-State Circuits 2020 [Refereed]
A 373 F 2 2D Power-Gated EE SRAM Physically Unclonable Function with Dark-Bit Detection Technique
Kunyang Liu, Yue Min, Xuan Yang, Hanfeng Sun, Hirofumi Shinohara
2018 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018 - Proceedings 161 - 164 2018.12 [Refereed]
Ruilin Zhang, Xingyu Wang, Luying Wang, Xinpeng Chen, Fan Yang, Kunyang Liu, Hirofumi Shinohara
2021 Symposium on VLSI Circuits 2021.06 [Refereed]
An Inverter-Based True Random Number Generator with 4-bit Von-Neumann Post-Processing Circuit
Xingyu Wang, Hongjie Liu, Ruilin Zhang, Kunyang Liu, Hirofumi Shinohara
Midwest Symposium on Circuits and Systems 2020-August 285 - 288 2020.08 [Refereed]
Excellent Student Award
2021.02 IEEE Fukuoka Section A 373-F2 0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and Vss Bias-Based Dark-Bit Detection
Winner: Kunyang Liu
Student Travel Grant Award
2018.11 IEEE Solid-State Circuits Society A 373 F2 2D Power-Gated EE SRAM Physically Unclonable Function with Dark-Bit Detection Technique
Winner: Kunyang Liu